Senior / Principal PIC Test Engineer Role Overview We are seeking an experienced PIC Test Engineer with deep expertise in both wafer- level and die-level optical and electrical test for Photonic Integrated Circuits (PICs). This role will own the test strategy and execution across the full product lifecycle—from early silicon bring-up through high-volume manufacturing (HVM). The ideal candidate is a recognized technical authority in test architecture, PIC Design-for-Test (DFT), yield learning, and factory scalability, with proven leadership in driving robust test solutions across multiple technology nodes and product families.
Key Responsibilities-
Wafer-Level Test Strategy & Architecture Define and own the wafer-level PIC test roadmap across multiple product lines and technology platforms. Architect scalable, high-throughput optical + electrical wafer probe solutions, balancing alignment accuracy, probe stability, and test time. Establish release criteria, guard-banding strategy, and wafer test coverage models aligned with product requirements. Die-Level Testing Define and own tests not carried out at wafer level. Examples include Optical Vector Analysis (OVA) testing, and polariazation-resolved testing.
First Silicon Bring-Up &Test Content Development Lead first-silicon bring-up efforts, including test content definition, limit setting, and characterization flows. Drive rapid yield-learning loops in partnership with design, process integration, and fabrication teams. Enable fast debug and iteration during early node transitions and new platform ramps. DFT & PDK Collaboration Influence PIC Design-for-Test features and PDK structures to improve wafer-level scalability, including:
- On-chip monitors
- Loopback paths
- Test waveguides
- Calibration structures
Partner with design teams to embed manufacturable test hooks early in the development cycle. Yield Ownership & Data-Driven Analysis Own wafer-level yield, parametric distributions, and systematic defect learning. Perform advanced spatial analytics using wafer maps and statistical methods to separate random vs systematic process issues. Lead root-cause investigations related to lithography bias and process drift. Manufacturing Readiness & Factory Scale-Up Establish golden wafer / golden die methodologies for production stability and tool correlation. Partner with foundries and OSATs to qualify wafer-level optical probe infrastructure. Drive successful transfer of test flows into volume manufacturing environments with strong cross-tool correlation. Technical Leadership & Team Development Serve as the technical escalation point during yield crises and manufacturing transitions. Mentor and develop junior engineers, setting engineering standards and best practices across wafer-level test programs. Multiply organizational impact through scalable infrastructure, DFT influence, and test standardization. Qualifications Required 10+ years of experience in PIC test engineering, wafer-level probing, or photonics manufacturing test. Proven ownership of wafer-level optical/electrical test strategy from R&D through HVM.
Expertise in: o Wafer-level optical probing o Die-level test development. For example: characterization of polarization splitter-rotators and characterization of component backreflection. o Probe card qualification o Yield learning and spatial analysis o Test time optimization o Foundry engagement and factory transfer
Preferred Experience with high-speed optical and electrical testing of photonic integrated circuits or optical transceivers. Experience specifically with silicon photonics PICs, testing over a broad wavelength range. Experience influencing PIC DFT and collaborating closely with PDK development teams. Strong background in high-volume semiconductor or photonics manufacturing ecosystems. Demonstrated leadership in scaling test infrastructure across multiple nodes and product families.
Seen 25 days ago.
Original posting on Xscape Photonics Inc's site ↗
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